TY - JOUR
N2 - The paper concerns the problem of treatment of the systematic effect as a part of the coverage interval associated with the measurement result. In this case the known systematic effect is not corrected for but instead is treated as an uncertainty component. This effect is characterized by two components: systematic and random. The systematic component is estimated by the bias and the random component is estimated by the uncertainty associated with the bias. Taking into consideration these two components, a random variable can be created with zero expectation and standard deviation calculated by randomizing the systematic effect. The method of randomization of the systematic effect is based on a flatten-Gaussian distribution. The standard uncertainty, being the basic parameter of the systematic effect, may be calculated with a simple mathematical formula. The presented evaluation of uncertainty is more rational than those with the use of other methods. It is useful in practical metrological applications.
L1 - http://rhis.czasopisma.pan.pl/Content/107071/PDF/Journal10178-VolumeXVII%20Issue3_11%20paper.pdf
L2 - http://rhis.czasopisma.pan.pl/Content/107071
PY - 2010
IS - No 3
EP - 446
DO - 10.2478/v10178-010-0037-1
KW - measurement uncertainty
KW - coverage interval
KW - systematic effect
KW - randomization
A1 - Fotowicz, PaweÅ‚
PB - Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation
DA - 2010
T1 - Systematic Effect as a Part of the Coverage Interval
SP - 439
UR - http://rhis.czasopisma.pan.pl/dlibra/publication/edition/107071
T2 - Metrology and Measurement Systems
ER -