The designing process of high resolution time interval measurement systems creates many problems that need to be eliminated. The problems are: the latch error, the nonlinearity conversion, the different duty cycle coefficient of the clock signal, and the clock signal jitter. Factors listed above affect the result of measurement. The FPGA (Field Programmable Gate Array) structure also imposes some restrictions, especially when a tapped delay line is constructed. The article describes the high resolution time-to-digital converter, implemented in a FPGA structure, and the types of errors that appear there. The method of minimization and processing of data to reduce the influence of errors on the measurement is also described.
This work shows a time-domain method for the discrimination and digitization of parameters of voltage pulses coming from optical detectors, taking into account the presence of electronic noise and afterpulsing. Our scheme is based on an FPGA-based time-to-digital converter as well as an adjustable-threshold comparator complemented with commercial elements. Here, the design, implementation and optimization of a multiphase TDC using delay lines shorter than a single clock period is also described. The performance of this signal processing system is discussed through the results from the statistical code density test, statistical distributions of measurements and information gathered from an optical detector. Unlike dual voltage threshold discriminators or constant-fraction discriminators, the proposed method uses amplitude and time information to define an adjustable discrimination window that enables the acquisition of spectra.