Studies of electrical properties, including noise properties, of thick-film resistors prepared from various resistive and conductive materials on LTCC substrates have been described. Experiments have been carried out in the temperature range from 300 K up to 650 K using two methods, i.e. measuring (i) spectra of voltage fluctuations observed on the studied samples and (ii) the current noise index by a standard meter, both at constant temperature and during a temperature sweep with a slow rate. The 1/f noise component caused by resistance fluctuations occurred to be dominant in the entire range of temperature. The dependence of the noise intensity on temperature revealed that a temperature change from 300 K to 650 K causes a rise in magnitude of the noise intensity approximately one order of magnitude. Using the experimental data, the parameters describing noise properties of the used materials have been calculated and compared to the properties of other previously studied thick-film materials.
Graphene is a very promising material for potential applications in many fields. Since manufacturing technologies of graphene are still at the developing stage, low-frequency noise measurements as a tool for evaluating their quality is proposed. In this work, noise properties of polymer thick-film resistors with graphene nano-platelets as a functional phase are reported. The measurements were carried out in room temperature. 1/f noise caused by resistance fluctuations has been found to be the main component in the specimens. The parameter values describing noise intensity of the polymer thick-film specimens have been calculated and compared with the values obtained for other thick-film resistors and layers used in microelectronics. The studied polymer thick-film specimens exhibit rather poor noise properties, especially for the layers with a low content of the functional phase.
Studies of noise properties of thick-film conducting lines from Au or PdAg conductive pastes on LTCC or alumina substrates are reported. Experiments have been carried out at the room temperature on samples prepared in the form of meanders by traditional screen-printing or laser-shaping technique. Due to a low resistance of the devices under test (DUTs), low-frequency noise spectra have been measured for the dc-biased samples arranged in a bridge configuration, transformer-coupled to a low-noise amplifier. The detailed analysis of noise sources in the signal path and its transfer function, including the transformer, has been carried out, and a procedure for measurement setup self-calibration has been described. The 1/f noise component originating from resistance fluctuations has been found to be dominant in all DUTs. The analysis of experimental data leads to the conclusion that noise is produced in the bends of meanders rather than in their straight segments. It occurs that noise of Au-based laser-shaped lines is significantly smaller than screen-printed ones. PdAg lines have been found more resistive but simultaneously less noisy than Au-based lines.
The paper presents the current state of knowledge concerning the sources of noise generated by wind turbines, force measurement methodology, and assessment of noise onerousness in this type of installation, on the basis of a study concerning a wind farm with five REpower MM92 wind turbines and the electric power of 2 MW and the sound power level of 104.2 dB(A) each. Particular attention was focused on the often discussed problem of presence of infrasound generated by turbines and on the requirements of the applicable reference methodologies for the measurement of wind speed to 5 m/s, while the turbine reaches its full power at speeds above 10 m/s.
Measurement of low-frequency noise properties of modern electronic components is a very demanding challenge due to the low magnitude of a noise signal and the limit of a dissipated power. In such a case, an ac technique with a lock-in amplifier or the use of a low-noise transformer as the first stage in the signal path are common approaches. A software dual-phase virtual lock-in (VLI) technique has been developed and tested in low-frequency noise studies of electronic components. VLI means that phase-sensitive detection is processed by a software layer rather than by an expensive hardware lock-in amplifier. The VLI method has been tested in exploration of noise in polymer thick-film resistors. Analysis of the obtained noise spectra of voltage fluctuations confirmed that the 1/f noise caused by resistance fluctuations is the dominant one. The calculated value of the parameter describing the noise intensity of a resistive material, C = 1·10−21 m3, is consistent with that obtained with the use of a dc method. On the other hand, it has been observed that the spectra of (excitation independent) resistance noise contain a 1/f component whose intensity depends on the excitation frequency. The phenomenon has been explained by means of noise suppression by impedances of the measurement circuit, giving an excellent agreement with the experimental data.
Low-frequency noise measurements have long been recognized as a valuable tool in the examination of quality and reliability of metallic interconnections in the microelectronic industry. While characterized by very high sensitivity, low-frequency noise measurements can be extremely time-consuming, especially when tests have to be carried out over an extended temperature range and with high temperature resolution as it is required by some advanced characterization approaches recently proposed in the literature. In order to address this issue we designed a dedicated system for the characterization of the low-frequency noise produced by a metallic line vs temperature. The system combines high flexibility and automation with excellent background noise levels. Test temperatures range from ambient temperature up to 300◦C. Measurements can be completely automated with temperature changing in pre-programmed steps. A ramp temperature mode is also possible that can be used, with proper caution, to virtually obtain a continuous plot of noise parameters vs temperature.
Low frequency noise is one of the most harmful factors occurring in human working and living environment. Low frequency noise components from 20 to 250 Hz are often the cause of employee complaints. Noise from power stations is an actual problem for large cities, including Cairo. The noise from equipments of station could be a serious problem for station and for environmental area. The development of power stations in Cairo leads to appearing a wide range of gas turbines which are strong source of noise. Two measurement techniques using C-weighted along side the A-weighted scale are explored. C-weighting is far more sensitive to detect low frequency sound. Spectrum analysis in the low frequency range is done in order to identify a significant tonal component. Field studies were supported by a questionnaire to determine whether sociological or other factors might influence the results by using annoyance rating mean value. Subjects included in the study were 153 (mean = 36.86, SD = 8.49) male employees at the three electrical power stations. The (C-A) level difference is an appropriate metric for indicating a potential low frequency noise problem. A-weighting characteristics seem to be able to predict quite accurately annoyance experienced from LFN at workplaces. The aim of the present study is to find simple and reliable method for assessing low frequency noise in occupational environment to prevent its effects on work performance for the workers. The proposed method has to be compared with European methods.
This paper presents the concept and modern technological approach to the fabrication of discrete, integrated and integral micropassives. The role of these components in modern electronic circuits is discussed too. The material, technological and constructional solutions and their relation with electrical and stability properties are analyzed in details for linear and nonlinear microresistors made and characterized at the Faculty of Microsystem Technology, Wrocław University of Technology.