Search results


  • Journals
  • Date

Search results

Number of results: 1
items per page: 25 50 75
Sort by:


This article presents combined approach to analog electronic circuits testing by means of evolutionary methods (genetic algorithms) and using some aspects of information theory utilisation and wavelet transformation. Purpose is to find optimal excitation signal, which maximises probability of fault detection and location. This paper focuses on most difficult case where very few (usually only input and output) nodes of integrated circuit under test are available.
Go to article

This page uses 'cookies'. Learn more