The paper deals with the problem of bias randomization in evaluation of the measuring instrument capability. The bias plays a significant role in assessment of the measuring instrument quality. Because the measurement uncertainty is a comfortable parameter for evaluation in metrology, the bias may be treated as a component of the uncertainty associated with the measuring instrument. The basic method for calculation of the uncertainty in modern metrology is propagation of distributions. Any component of the uncertainty budget should be expressed as a distribution. Usually, in the case of a systematic effect being a bias, the rectangular distribution is assumed. In the paper an alternative randomization method using the Flatten-Gaussian distribution is proposed.
The paper concerns the problem of treatment of the systematic effect as a part of the coverage interval associated with the measurement result. In this case the known systematic effect is not corrected for but instead is treated as an uncertainty component. This effect is characterized by two components: systematic and random. The systematic component is estimated by the bias and the random component is estimated by the uncertainty associated with the bias. Taking into consideration these two components, a random variable can be created with zero expectation and standard deviation calculated by randomizing the systematic effect. The method of randomization of the systematic effect is based on a flatten-Gaussian distribution. The standard uncertainty, being the basic parameter of the systematic effect, may be calculated with a simple mathematical formula. The presented evaluation of uncertainty is more rational than those with the use of other methods. It is useful in practical metrological applications.