Details

Title

The problem of information leak due to parasitic loop currents and voltages in the KLJN secure key exchange scheme

Journal title

Metrology and Measurement Systems

Yearbook

2019

Volume

vol. 26

Numer

No 1

Authors

Keywords

unconditional security ; key exchange ; parasitic loop currents and voltages ; information leak

Divisions of PAS

Nauki Techniczne

Coverage

37-40

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2019.04.01

Type

Artykuły / Articles

Identifier

ISSN 0860-8229

DOI

10.24425/mms.2019.126335

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