Details

Title

Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique

Journal title

Metrology and Measurement Systems

Yearbook

2015

Volume

vol. 22

Numer

No 4

Authors

Keywords

1/f noise ; polymer thick-film resistor ; low-frequency noise measurements ; virtual lock-in

Divisions of PAS

Nauki Techniczne

Coverage

503-512

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2015[2015.01.01 AD - 2015.12.31 AD]

Type

Artykuły / Articles

Identifier

ISSN 0860-8229

DOI

10.1515/mms-2015-0051

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