Details

Title

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Journal title

Metrology and Measurement Systems

Yearbook

2013

Numer

No 4

Authors

Keywords

PTC chip sensors ; noise spectroscopy ; I-V characteristic non-linearity ; quality evaluation

Divisions of PAS

Nauki Techniczne

Coverage

635-644

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2013

Type

Artykuły / Articles

Identifier

ISSN 0860-8229

DOI

10.2478/mms-2013-0054

×